Multi-Hit SFX using MHz XFEL sources
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
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Type | Source | Accession Code | Details |
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experimental model | PDB | 6FTR | |
Crystallization
Crystalization Experiments |
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ID | Method | pH | Temperature | Details |
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1 | BATCH MODE | 3.5 | 293 | NaCl, ethylene glycol, PEG 3350, acetate buffer pH 3.5 |
Crystal Properties |
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Matthews coefficient | Solvent content |
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2.07 | 40.56 |
Crystal Data
Unit Cell |
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Length ( Å ) | Angle ( ˚ ) |
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a = 79.3 | α = 90 |
b = 79.3 | β = 90 |
c = 37.73 | γ = 90 |
Symmetry |
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Space Group | P 43 21 2 |
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Diffraction
Diffraction Experiment |
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
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1 | 1 | x-ray | 293 | PIXEL | AGIPD | | 2017-09-14 | M | SINGLE WAVELENGTH |
Radiation Source |
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
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1 | FREE ELECTRON LASER | EUROPEAN XFEL BEAMLINE SPB/SFX | 1.3332 | European XFEL | SPB/SFX |
Serial Crystallography
Sample delivery method |
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Diffraction ID | Description | Sample Delivery Method |
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1 | | injection |
Data Collection
Overall |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
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1 | 2.1 | 21.66 | 98.5 | 0.615 | 2.9 | 1 | | 7310 | | | |
Highest Resolution Shell |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
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1 | 2.1 | 2.155 | 92.34 | | 0.372 | | | |
Refinement
Statistics |
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B |
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X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 6FTR | 2.1 | 21.66 | 6547 | 716 | 97.75 | 0.2541 | 0.249 | 0.25 | 0.2987 | 0.3 | RANDOM | 20.395 |
Temperature Factor Modeling |
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
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-0.19 | | | -0.19 | | 0.37 |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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r_dihedral_angle_2_deg | 28.455 |
r_dihedral_angle_4_deg | 17.333 |
r_dihedral_angle_3_deg | 14.096 |
r_dihedral_angle_1_deg | 6.823 |
r_angle_refined_deg | 1.254 |
r_angle_other_deg | 1.196 |
r_rigid_bond_restr | 0.762 |
r_chiral_restr | 0.053 |
r_bond_refined_d | 0.004 |
r_gen_planes_refined | 0.004 |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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r_dihedral_angle_2_deg | 28.455 |
r_dihedral_angle_4_deg | 17.333 |
r_dihedral_angle_3_deg | 14.096 |
r_dihedral_angle_1_deg | 6.823 |
r_angle_refined_deg | 1.254 |
r_angle_other_deg | 1.196 |
r_rigid_bond_restr | 0.762 |
r_chiral_restr | 0.053 |
r_bond_refined_d | 0.004 |
r_gen_planes_refined | 0.004 |
r_bond_other_d | 0.002 |
r_gen_planes_other | 0.001 |
Non-Hydrogen Atoms Used in Refinement |
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Non-Hydrogen Atoms | Number |
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Protein Atoms | 1001 |
Nucleic Acid Atoms | |
Solvent Atoms | 29 |
Heterogen Atoms | 39 |
Software
Software |
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Software Name | Purpose |
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Aimless | data scaling |
PHASER | phasing |
REFMAC | refinement |
PDB_EXTRACT | data extraction |
Cheetah | data collection |
Coot | model building |
CrystFEL | data reduction |