RT XFEL structure of the three-flash state of Photosystem II (3F, S0-rich) at 2.04 Angstrom resolution
Serial Crystallography (SX)
Serial Crystallography (SX)
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
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Type | Source | Accession Code | Details |
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experimental model | PDB | 5KAF | |
Crystallization
Crystalization Experiments |
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ID | Method | pH | Temperature | Details |
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1 | BATCH MODE | 6.5 | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 |
Crystal Properties |
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Matthews coefficient | Solvent content |
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3.38 | 63.61 |
Crystal Data
Unit Cell |
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Length ( Å ) | Angle ( ˚ ) |
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a = 116.86 | α = 90 |
b = 221.188 | β = 90 |
c = 307.559 | γ = 90 |
Symmetry |
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Space Group | P 21 21 21 |
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Diffraction
Diffraction Experiment |
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
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1 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2016-07-14 | M | SINGLE WAVELENGTH |
3 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2017-07-13 | M | SINGLE WAVELENGTH |
2 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2016-10-20 | M | SINGLE WAVELENGTH |
Radiation Source |
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
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1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX |
3 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX |
2 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX |
Serial Crystallography
Sample delivery method |
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Diffraction ID | Description | Sample Delivery Method |
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1 | | fixed target |
Measurement |
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Diffraction ID | Pulse Duration | Pulse Repetition Rate | Focal Spot Size | Pulse Energy | Photons Per Pulse |
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1 | 40 (fs) | 10 | 3 | 9.515 (KeV) | |
Data Collection
Overall |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
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1 | 2.04 | 31 | 99.96 | 0.986 | 16.998 | 225.67 | | 502298 | | | |
Highest Resolution Shell |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
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| 2.04 | 2.075 | 99.97 | | 0.008 | 0.554 | 12.9 | |
Refinement
Statistics |
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | Mean Isotropic B |
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X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 5KAF | 2.04 | 31.005 | 1.33 | 501450 | 4452 | 99.83 | 0.1869 | 0.1864 | 0.2485 | 45.3348 |
Temperature Factor Modeling |
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
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| | | | | |
Non-Hydrogen Atoms Used in Refinement |
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Non-Hydrogen Atoms | Number |
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Protein Atoms | 41576 |
Nucleic Acid Atoms | |
Solvent Atoms | 1880 |
Heterogen Atoms | 19208 |
Software
Software |
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Software Name | Purpose |
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PHENIX | refinement |
PDB_EXTRACT | data extraction |
cctbx.xfel | data reduction |
PHASER | phasing |